Atomic Force Microscopy as a tool for the study and manipulation of surface plasmons in situ
نویسندگان
چکیده
Surface plasmons (SP) are coherent electronic waves at an interface, often studied at dielectric-metal interfaces. Their properties have been the focus of intense scrutiny due to their potential application across a wide variety of fields, including the development of novel electrooptic devices and a variety of sensing techniques. The experimental realisation of such devices is heavily dependent on the ability to controllably manipulate the propagation of SPs on a metaldielectric interface. Therefore, many groups are attempting to build optics for SPs that are analogous to conventional optics for free-space radiation.
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